Bruker Dimension Icon® Atomic Force Microscope (AFM) is renowned for its exceptional performance and versatility in nanoscale research. This advanced system offers superior resolution with sub-angstrom noise levels in the Z-axis and angstrom-level precision in the XY plane, enabling artifact-free imaging within minutes. The open-access platform supports various experiments, modes, and semi-automated measurements, for example electrical, magnetic or materials properties of the sample. Our AFM offers innovative PeakForce Tapping technology, which allows parallel data collection of topographic, electrical and mechanical properties.